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The Statistical Analysis of Failure Time Data (Wiley Series in Probability and Statistics) John D. Kalbfleisch Ross L. Prentice
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A number of livelihood tools in food security assessment including focus group discussions, key informant interviews, direct observations and a household questionnaire survey, were used to collect the data. For distantly related kin, the level of emotional closeness mediated this relationship - when emotional closeness was controlled for, there was no effect of genetic relatedness on travel time. The Statistical Analysis of Failure Time Data . 79.Bayesian Statistics and Marketing 80.Statistical Shape Analysis 81.Nonparametric Statistics with Applications to Science and Engineering 82.Longitudinal Data Analysis 83.Regression Models for Time Series Analysis 84. The Statistical Analysis of Failure Time Data (Wiley Series in Probability and Statistics). Hoboken, New Jersey: Wiley Series in Probability and Statistics; 2002. All statistical tests were performed at 5% significance level. The Statistical Analysis of Failure Time Data (Wiley Series in Probability and Statistics) (Hardcover) by John D. Data Analysis · Statistical Analysis · American Statistical Association · Journal · Graduate Students. A History of Probability and Statistics and Their Applications before 1750 (Wiley Series in Probability and Statistics) By Anders Hald Publisher: Wiley-Interscience Number Of Pages: 608. Questionnaire responses were edited, coded and analyzed using SPSS version 18.0 for Windows. Or trait will be favoured by selection when r*B>C, where C is the fitness cost to the actor, B is the fitness benefit to the recipient and r is the coefficient of genetic relatedness – the probability that two individuals share the same genes by descent [1]. The Statistical Analysis of Failure Time Data, 2nd Edition (Wiley Series in Probability and Statistics). *FREE* super saver shipping on qualifying … Shop The Statistical Analysis of Failure Time Data (Wiley Series in The Statistical Analysis of Failure Time Data (Wiley Series in Probability and Statistics) [John D.